Moderate extra thickness on designers initials LB and UNITED STATES. Light extra thickness on designers initials JFM and OF AMERICA. Distortion on E PLURIBUS UNUM.

Die Markers:
Obverse: Die gouge far below the 5 in the date.
Reverse: Numerous die chips on the top of the shield, the strongest being above the first U in PLURIBUS.

Submitted by: David Curfman