This is an old revision of the document!

2009-P Guam Quarter Die Varieties

Doubled Die Obverses

Designation	Description	Image
CRDO-001	Doubling to the south below the earlobe. Die Markers: Obverse: Die crack through the designers initials JF and UC. Die gouge above the queue. Reverse: Die gouge left of the top of the P in PLURIBUS. Die gouge between the U and N in UNUM. Die gouge below the N in GUAHAN. Die gouge to the left of the top of the sail.
Designation	Description	Image
CRDO-002	Doubling to the south below the earlobe. Die Markers: Obverse: Die crack through the designers initials JF and UC. Die gouge touches the bottom left of the R in TRUST. Reverse: Die gouge below the left side of the first U in PLURIBUS.